iKon M - SO by Andor Technology

Manufacturer Andor Technology
Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface. Andor’s USB 2.0 iKon-M SO 934 series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal t... Read more


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iKon M - SO
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Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons.

A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface. Andor’s USB 2.0 iKon-M SO 934 series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface.

iKon-M SO features the industry-leading Thermo-Electric (TE) cooling platform, delivering down to -100°C cooling performance and ensuring access to the lowest dark current.

This 1024 x 1024 sensor array with 13 μm x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of kHz and Multi-MHz readout speeds provide exceptionally low readout noise and faster frame rates respectively.