Hyperion FT-IR

Manufacturer Bruker Optik GmbH
3.9
/
5.0
  |  5 reviews


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Average Rating: 3.9
5 Scientists have reviewed this product

4 out of 5
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money


Rating: 3.3

"This product is easy to use and allows us to obtain data of good reproducibility and spectra of good quality (high signal to noise ratio). So I recommend it for this reason but we had frequently some technical problems that could not always been resolved rapidly and easily."

Review date: 04 Sep 2015 | Hyperion FT-IR
  • Status:

    Reviewer

  • Member since: 2015

  • Organization: Henkel



  • Ease of use
    3 out of 5
    After sales service
    3 out of 5
    Value for money
    3 out of 5
Rating: 3.0
"Generally easy to use, but there are some bugs in software."

Review date: 04 Sep 2015 | Hyperion FT-IR
  • Status:

    Expert Reviewer

  • Member since: 2010

  • Organization: Dr D Y Patil Institute of Pharmaceutical Sciences And Research



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
Best in class type of microscope, having high sensitivity, lateral resolution and sampling flexibility.
Rating: 5.0

  • Application Area:materials research, polymers, chemicals, forensics, art conservation, and life sciences.

"Best in class type of microscope, having high sensitivity, lateral resolution, sampling flexibility, easy to use software and an easy Spectrometer Diagnostic Flexible design "

Review date: 21 Aug 2015 | Hyperion FT-IR
  • Status:

    Reviewer

  • Member since: 2011

  • Organization: rap.ID



  • Ease of use
    3 out of 5
    After sales service
    5 out of 5
    Value for money
    3 out of 5
Rating: 3.7

  • Application Area:FTIR microscope

"This high-end microscope offers great spectral quality, signal to noise, and software that is excellent at removing atmospheric noise. The spectral search methods include peak searching which works well. The digital imaging capabilities make it easy to interpret, understand, and communicate results. Since it is high-end and complex, it is not that easy or simple to use, but once learned, it is not that difficult. The company support is fast, they understand the problems, and offer very clear solutions. The software could be made easier and more straight forward. As for value for money, I was not involved in the specification or purchase."

Review date: 17 Jun 2013 | Hyperion FT-IR
  • Status:

    Reviewer

  • Member since: 2011

  • Organization: rap.ID



  • Ease of use
    3 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
Rating: 4.3

  • Application Area:FTIR

"Great reproducible results, high sensitivity. Service is great, they answer my numerous questions quickly. It takes some learning, but then is easy. I would recommend this to anyone."

Review date: 23 May 2013 | Hyperion FT-IR
HYPERION stands for highest sensitivity at the highest spatial resolution in FT-IR microscopy and chemical imaging. It is designed without compromises, to combine best performance for visible inspection and infrared spectral analysis of any sample.

The HYPERION is the culmination of more than 30 years of experience in FT-IR microscopy. Its high-quality design, including all optical, mechanical, and electronic components, provides high stability and reliability. Featuring many contrast enhancement tools, a wide variety of dedicated objectives, and chemical imaging, the HYPERION enables you to conduct the most sensitive microanalysis easily and efficiently.

With its modular design, the HYPERION can be customized to the specific requirements of each application. Its field of use is extremely broad and includes materials research, polymers, chemicals, forensics, art conservation, and life sciences.


Hyperion FT-IR Features:

  • Highest spatial resolution, limited only by diffraction of light
  • Highest sensitivity even at high spatial resolution
  • Attenuated total reflectance (ATR) objective with internal pressure sensor and highly accurate and stable column guidance mechanism for precise crystal positioning
  • Dedicated grazing angle objective (GAO) with dual pass design for the analysis of thin layers on metallic surfaces
  • Automated FT-IR mapping with all measurement modes
  • All-in-one spectroscopic software for data acquisition, analysis and documentation
  • FT-IR imaging with modern focal plane array (FPA) detector technology