The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and highest quality sample preparation.
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Helios NanoLab™ - DualBeam™
Average Rating: 4.1
4 Scientists have reviewed this product
Status:
Reviewer
Member since: 2012
Organization: UNIVERSITY OF CAMBRIDGE
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- Ease of use
- After sales service
- Value for money
Rating: 4.0
Application Area: 3D Imaging
"The automation processes involved with this microscope enable fast acquisition of 3D volumes. The alignment processes are very quick to perform and reliable, although some fine tuning is needed for very accurate imaging. The reliability of the machine allows for the microscope to be left running for days without intervention. Above all, the image quality is amazing allowing near nanometer resolution across a few microns, allowing bulk material to be analysed in detail."
Review date: 13 Nov 2012 | Helios NanoLab™ - DualBeam™
Status:
Reviewer Member since: 2012
Organization: TU Causthal
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- Ease of use
- After sales service
- Value for money
Rating: 4.7
Review date: 04 Jul 2012 | Helios NanoLab™ - DualBeam™
Application Area:FESEM Electron Microscopy
"Very good instrument for nano analytics, it's very flexible with a nice cryo chamber. Produces high quality pictures."
Review date: 04 Jul 2012 | Helios NanoLab™ - DualBeam™
Status:
Reviewer Member since: 2010
Organization: UNC-CH
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- Ease of use
- After sales service
- Value for money
Rating: 3.7
Review date: 15 Apr 2010 | Helios NanoLab™ - DualBeam™
"A very useful system and prompt service."
Review date: 15 Apr 2010 | Helios NanoLab™ - DualBeam™
Status:
Reviewer Member since: 2010
Organization: UNC Chapel Hill
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- Ease of use
- After sales service
- Value for money
Rating: 4.0
Review date: 15 Apr 2010 | Helios NanoLab™ - DualBeam™
"An excellent FIB instrument."
Review date: 15 Apr 2010 | Helios NanoLab™ - DualBeam™
The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and highest quality sample preparation.
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