HA_NC Etalon AFM Mode Contact Probe

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HA_NC Etalon AFM Mode Contact Probe
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HA_NC Etalon AFM Mode Contact Probe from K-TEK Nano

K-TEK Nanotechnolgy's dual cantilever Etalon probe features: 

• High aspect ratio tip 
• Precisely specified resonant frequency 
• Enhanced reflection 
• Economic price

Main characteristics of the HA_NC Etalon AFM Mode Contact Probe: 

• Standard chip size: 1.6x3.6x0.45 mm. 
• High reflective Au coating. 
• Typical curvature radius of a tip: 10 nm. 
• Total tip height : 9 - 16 µm. 
• Each chip has two RECTANGULAR springs. 
• Recommended for noncontact/semicontact modes. 
• Packaged in GelPak® boxes.

Receive your quote directly from K-TEK Nanotechnology.

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Description

HA_NC Etalon AFM Mode Contact Probe from K-TEK Nano

K-TEK Nanotechnolgy's dual cantilever Etalon probe features: 

• High aspect ratio tip 
• Precisely specified resonant frequency 
• Enhanced reflection 
• Economic price

Main characteristics of the HA_NC Etalon AFM Mode Contact Probe: 

• Standard chip size: 1.6x3.6x0.45 mm. 
• High reflective Au coating. 
• Typical curvature radius of a tip: 10 nm. 
• Total tip height : 9 - 16 µm. 
• Each chip has two RECTANGULAR springs. 
• Recommended for noncontact/semicontact modes. 
• Packaged in GelPak® boxes.

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HA_NC Etalon AFM Mode Contact Probe

by K-TEK Nanotechnology

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