The new JASCO FT/IR-4200 was designed to provide operational features and sensitivity levels found only in more expensive instruments.
The innovative technology incorporated in this instrument results in exceptionally high signal-to-noise ratio specifications. This model offer exceptional flexibility and can be easily upgraded to meet new requirements. Optional expandability includes microanalysis with an IR microscope, IR imaging with a multichannel microscope, and rapid scan option. The JASCO Quick Start System enables users of all experience levels to measure samples and perform data processing functions quickly and easily with a simple push of a button.
Max resolution: 0.5 cm-1
S/N ratio: 30,000:1
The FT/IR-4200 offers excellent resolution and sensitivity levels to accommodate a variety of complex IR demands. It is suitable for research, development, and quality control applications where high levels of accuracy and precision are required. The FT/IR-4200 can be used for the measurement of both solid and gaseous samples.
Signal to Noise Ratio: &nsbp;30000:1
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