FMG01 AFM Mode Non-Contact Force Modulation Probe



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K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe

This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.

Available Options with the FMG01 AFM Mode Non-Contact Force Modulation Probe:

-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply.

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FMG01 AFM Mode Non-Contact Force Modulation Probe

Manufacturer K-TEK Nanotechnology

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