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Member since: 2011
Organization: Welding Research Institute
Application Area: Material both metallic as well as non-metallic samples can be analyzed
"Highly precise analytical equipment and it gives images with high resolution. Shows fast scanning electron micrograph and phase information/details. It is worth for price as it gives detail information for both solid as well as powder samples. All analytical labs should have this SEM. "
Member since: 2012
Organization: Kantonspolizei Bern
Application Area:Forensic / Material Analysis
"The SEM from ZEISS is very easy to use and I can strongly recommend it. Use the long-life-cathodes and you'll be happy."
Member since: 2009
Organization: Canadian Nuclear Safety Commission
"I rated its ease of use to be above average because the system can be unstable, especially with back-scattered electron detector. After sales support has been excellent, though with a not-cheap service agreement. All in all, I think the product is worth the money we paid."
The ZEISS EVO series combines high definition Scanning Electron Microscopy with high throughput automated workflow.
Discover substantial improvements in productivity through the 4-step workflow. Simplify routine imaging tasks and benefit from powerful automated features that deliver fast time to image and a reduction of training overhead, especially in a multi-user environment.
Experience excellence in HV, VP and EP imaging, thanks to the latest detector technology. Dramatic improvements in signal yield and contrast ratio herald a step change in imaging efficiency.
EVO is the most flexible high definition imaging and analysis tool delivering fast, accurate, repeatable results across all samples.
High Definition In All Vacuum Modes
Intelligent Imaging – High Throughput
As Flexible As It Is Easy To Use