ZEISS EVO HD by ZEISS Research Microscopy Solutions
Manufacturer ZEISS Research Microscopy Solutions
High performance, total flexibility EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning electron microscopy The unmatched low-kV resolution makes the EVO HD the premier choice for challenging specimens, the imaging of surface detail and for beam-sensitive materials. Enhanced analytical accuracy required for a wide range of applications is realized by clear resolution improvements at high probe currents. This ... Read more
ZEISS EVO HD
High performance, total flexibility
EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning electron microscopy
The unmatched low-kV resolution makes the EVO HD the premier choice for challenging specimens, the imaging of surface detail and for beam-sensitive materials. Enhanced analytical accuracy required for a wide range of applications is realized by clear resolution improvements at high probe currents.
This technology demonstrates unchallenged performance in the conventional SEM (C-SEM) arena. EVO HD dramatically reduces the gap in imaging resolution between C-SEM and field emission SEM (FE-SEM).
With this step-change in resolution, EVO HD now advances knowledge in those applications that were previously limited in conventional SEMs, such as:
•Nano Materials
•Fracture Mechanics
•Geological Applications
•Microbiology
At the forefront of conventional electron microscopy, EVO HD is the technology of choice for applications where high performance is a prerequisite. Choose from EVO HD MA for materials analysis or EVO HD LS for life sciences.
EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning electron microscopy
The unmatched low-kV resolution makes the EVO HD the premier choice for challenging specimens, the imaging of surface detail and for beam-sensitive materials. Enhanced analytical accuracy required for a wide range of applications is realized by clear resolution improvements at high probe currents.
This technology demonstrates unchallenged performance in the conventional SEM (C-SEM) arena. EVO HD dramatically reduces the gap in imaging resolution between C-SEM and field emission SEM (FE-SEM).
With this step-change in resolution, EVO HD now advances knowledge in those applications that were previously limited in conventional SEMs, such as:
•Nano Materials
•Fracture Mechanics
•Geological Applications
•Microbiology
At the forefront of conventional electron microscopy, EVO HD is the technology of choice for applications where high performance is a prerequisite. Choose from EVO HD MA for materials analysis or EVO HD LS for life sciences.
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