EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning electron microscopy
The unmatched low-kV resolution makes the EVO HD the premier choice for challenging specimens, the imaging of surface detail and for beam-sensitive materials. Enhanced analytical accuracy required for a wide range of applications is realized by clear resolution improvements at high probe currents.
This technology demonstrates unchallenged performance in the conventional SEM (C-SEM) arena. EVO HD dramatically reduces the gap in imaging resolution between C-SEM and field emission SEM (FE-SEM).
With this step-change in resolution, EVO HD now advances knowledge in those applications that were previously limited in conventional SEMs, such as: •Nano Materials •Fracture Mechanics •Geological Applications •Microbiology
At the forefront of conventional electron microscopy, EVO HD is the technology of choice for applications where high performance is a prerequisite. Choose from EVO HD MA for materials analysis or EVO HD LS for life sciences.
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