ElementEye JSX-1000S EDXRF by JEOL USA
An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed.
The ElementEye is capable of 50kV excitation and features our newest silicon drift detector (SDD) technology. Coupled with JEOL's advanced Fundamental Parameters (FP) method, t...
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