Dimension Icon Atomic Force Microscope by Bruker Nano Surfaces and Metrology
Status:
Advanced Reviewer
Member since: 2019
Organization: University College London
-
- Ease of use
- After sales service
- Value for money
Great results
Application Area: Materials morphology
"Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours."
Review date: 01 Dec 2021 | Dimension Icon Atomic Force Microscope
Status:
Advanced Reviewer Member since: 2019
Organization: University College London
-
- Ease of use
- After sales service
- Value for money
Great results.
Application Area:Materials
"By combining the peak force tapping with electrochemical operation in liquid, in addition to surface topography, the electrochemical AFM can also provide corresponding mechanical, and electrochemical feature mapping of the sample. With all the advantages of EC-AFM, it can deliver excellent performance for in-situ analysis with nano-scale resolution of electrochemical cell during electrochemical reactions."
Review date: 10 Feb 2020 | Dimension Icon Atomic Force Microscope
Status:
Reviewer Member since: 2019
Organization: INL
-
- Ease of use
- After sales service
- Value for money
User friendly simple equipment.
Application Area:Nanoscale surface studies
"We have achieved reliable results. Very good platform."
Review date: 23 Mar 2019 | Dimension Icon Atomic Force Microscope
Status:
Reviewer Member since: 2017
Organization: Laboratorio NEST -Scuola Normale Superiore
-
- Ease of use
- After sales service
- Value for money
We are very satisfied!
Application Area:Semiconductor samples (SiO2, graphene, nanowires), polymeric samples
"The Bruker ICON AFM system was installed four years ago in our clean room facility and it revealed as a unique instruments for its capability to perform low-noise and high-resolution imaging for many users, on many kind of samples and with reliable performances! “ScanAsyst” mode preserves the AFM probes in good condition for weeks and allow to any student to be independent and to start the measurements after a short training. We have also the Quantitative Nano machanics (QNM) module, taht allows to perform spatially resolved measurements od mechanical properties of the sample (stiffness, adhesion, dissipation, Young's module) in real time. From this point of vies the system is pretty unique, allowing to acquire for each single point a complete force-vs-distance curve."
Review date: 12 Mar 2018 | Dimension Icon Atomic Force Microscope
The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.
The Icon is also equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level. The Icon’s uncommon ease of use, ultimate performance, exceptional productivity, and superior versatility make it an ideal choice for practically every AFM application.
Dimension Icon Atomic Force Microscope Features:
- Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on large-sample AFMs
- Significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in TappingMode™
- Drift rates less than 200pm per minute render distortion-free images
- Integrated feedback alignment tools deliver quick and optimized probe positioning
- High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
- ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings
- Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
- Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques
- Custom user-programmable scripts offer semi-automated measurement and analysis
Product Overview
Dimension Icon Atomic Force Microscope
Manufacturer Bruker Nano Surfaces and Metrology
4.9 / 5.0 | 4 reviews
