Dektak® 8 Advanced Development Profiler

 3.3/5.0 (1 review)
  • Ease of use 4 out of 5
  • After sales service 2 out of 5
  • Value for money 4 out of 5

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Dektak® 8 Advanced Development Profiler

Description

 

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

Reviews

Klaus Heinzinger


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Member since 2008

Organization:
PNSensor GmbH
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RATING: 3.3

  • 4 out of 5EASE OF USE
  • 2 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 21 Jul 2008

Dektak® 8 Advanced Development Profiler

"this is a very flexible instrument, but we find there are some software constraints."

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