Dektak® 8 Advanced Development Profiler

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Dektak® 8 Advanced Development Profiler
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The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

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VEECO Instruments Inc.

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Average Rating: 3.3

Ease of use
4 out of 5
After sales service
2 out of 5
Value for money
4 out of 5

Description

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

Product Overview

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Dektak® 8 Advanced Development Profiler

by VEECO Instruments Inc.

3.3/5.0 (1 reviews)
Ease of use
4 out of 5
After sales service
2 out of 5
Value for money
4 out of 5

VEECO Instruments Inc.







Receive your quote directly from VEECO Instruments Inc. for Dektak® 8 Advanced Development Profiler

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