Dektak® 8 Advanced Development Profiler

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Dektak® 8 Advanced Development Profiler
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The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.


VEECO Instruments Inc.

Receive your quote directly from VEECO Instruments Inc. for Dektak® 8 Advanced Development Profiler

Reviews

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Average Rating: 3.3

Ease of use
4 out of 5
After sales service
2 out of 5
Value for money
4 out of 5
Rating: 3.3
Ease of use
4 out of 5
After sales service
2 out of 5
Value for money
4 out of 5
  • Review date: 21 Jul 2008

  • Dektak® 8 Advanced Development Profiler

"this is a very flexible instrument, but we find there are some software constraints."

Description

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

Product Overview

Product Image

Dektak® 8 Advanced Development Profiler

by VEECO Instruments Inc.

3.3/5.0 (1 reviews)
Ease of use
4 out of 5
After sales service
2 out of 5
Value for money
4 out of 5

VEECO Instruments Inc.







Receive your quote directly from VEECO Instruments Inc. for Dektak® 8 Advanced Development Profiler