Dektak® 8 Advanced Development Profiler by VEECO Instruments Inc.
Manufacturer VEECO Instruments Inc.
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.
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Dektak® 8 Advanced Development Profiler
Average Rating: 3.3
1 Scientist has reviewed this product
Status:
Reviewer
Member since: 2008
Organization: PNSensor GmbH
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- Ease of use
- After sales service
- Value for money
Rating: 3.3
"this is a very flexible instrument, but we find there are some software constraints."
Review date: 21 Jul 2008 | Dektak® 8 Advanced Development Profiler
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.
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