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1 Scientist has reviewed this product
4 out of 5
Ease of use
2 out of 5
After sales service
4 out of 5
Value for money
"this is a very flexible instrument, but we find there are some software constraints."
Review date: 21 Jul 2008 |
Dektak® 8 Advanced Development Profiler The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.