CSG30 AFM-Mode Probes by K-TEK Nanotechnology
Manufacturer K-TEK Nanotechnology
K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe
This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip coating* -Bare -Tipless*... Read more
CSG30 AFM-Mode Probes
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K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe
This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe:
-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*
*Quantity & cantilever restrictions apply.
Product Overview
