This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe:
-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
*Quantity & cantilever restrictions apply.