K-TEK CSG01 AFM Mode Contact Probe
This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharp...read more
This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the CSG01 AFM Mode Contact Probe:
-PtIr, TiN, and Au tip coatings -CoCr magnetic tip coating* -Bare -Tipless*
*Quantity & cantilever restrictions apply.
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