ZEISS Crossbeam FIB-SEM by ZEISS Research Microscopy Solutions
Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and na...
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