Certus 3D - Dualbeam by FEI Company
The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies.
With its TEMLink™ 100 option, the Certus-3D also can automate TEM sample preparation for higher-resolution imaging and analysis. The Certus-3D system uses programmable recipes for precise and repeatable location and milling, wafer after wafer.
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