Cary 7000 Universal Measurement Spectrophotometer by Agilent Technologies

The Agilent Cary 7000 universal measurement spectrophotometer (UMS) will satisfy all your solid sampling needs. Collect hundreds of UV-Vis-NIR spectra overnight, or characterize optical components or thin films in minutes to hours rather than hours to days. The Cary 7000 UMS is a turn-key solution for research, development, and QA/QC in optics, thin films/coatings, solar, and glass.

The multi-angle specular reflectance and transmittance capabilities allow you to design experiments never before possible—expanding your research—while the automated reflectance and transmission will save you time and money.

Features:

• Achieve complete sample characterization
• Measure absolute reflection and transmission in a single sequence—at variable angle and s or p polarization—without moving or disturbing the sample.
• Measure diffusely scattered transmission and reflection with the freedom to control detector and sample position independently
• Utilize the huge sample chamber to accommodate all sample types—from small to large—delivering 360 degrees of rotational flexibility
• Obtain complete control of beam collimation and patch size to best suit your sample and measurement needs
• Lower your cost-per-analysis, saving you time and money
• Measure in minutes what other systems take hours to days to complete—with unattended automation
• Simply set up your method, collect a single baseline, insert one or more samples, and walk away
• New insights into advanced materials with an unprecedented 10 Abs range
• With 10 Abs range on the Cary 7000 spectrophotometer, the Cary 7000 UMS ensures you obtain high quality results even with challenging sample measurements, such as high optical density (OD) or under difficult measurement conditions
• Obtain the highest quality results fast with the next generation Cary WinUV software
• The Cary WinUV software features a new method editor for simple method setup, advanced data processing, and 3D graphics, ensuring fast and accurate data analysis