The number one choice in polarizing microscopy
For all applications of polarizing microscopy, whether in geology, mineralogy, crime detection, materials testing, materials research or other fields.
Innovative and flexible through new, unique contrast and measuring techniques in addition to all common methods; available for transmitted light or transmitted-plus-reflected light. Multifaceted and economic through outstanding features and intelligent details, such as sextuple revolving nosepiece, 5-place reflector turret, or a new object holder with optimum positioning range.
Simply the perfect platform for all polarizing and materials microscopy applications: Axioskop 40 Pol for orthoscopy, Axioskop 40 Pol for ortho- and conoscopy, and Axioskop 40 A Pol for ortho- and conoscopy (transmitted and reflected light).