ZEISS Axio CSM 700 by ZEISS Research Microscopy Solutions

Explore the functionality of a 3D non-contact optical profilometer
Measure surface topography and roughness accurately and quickly with Axio CSM 700: Non-contact image acquisition with true color in just seconds. Just think how that will simplify your routine, improve results and increase productivity.

Determine the surface roughness and measure heights of 20 nm step height up to the millimeter range in a vibration-free environment. With Axio CSM 700 you detect the light intensity and capture the height of your sample again and again - with absolute precision.

Your sample remains untouched during topographic measurement at more than 100 frames per second. Axio CSM 700 operates accurately with true color topographies – in three dimensions and at high resolution. The software is very easy to use with a number of analysis options, such as surface roughness measurements, layer thickness determination, and volume, angle and contact ratio measurements.