Atomic Force Microscope alpha300 A - High-Performance User-Friendly AFM for Materials Research, Life Sciences and Nanotechnology The alpha300 A integrates an Atomic Force Microscope (AFM) system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. Switching between AFM and optical mode is simply done by rotating the turret. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors. All standard AFM modes are supported with the alpha300 A, assuring the highest flexibility throughout the full range of AFM applications....Read more
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