The WITec alpha300 A atomic force microscope features exceptional capability along with an uncommon versatility. It combines AFM with a research-grade optical microscope. The seamless integration of the two techniques allows simultaneous cantilever and sample observation for user-friendly cantilever positioning and rapid alignment.
WITec’s unique inertial drive AFM module and TrueScan dynamic position error correction provide exceptional mechanical precision and reproducibility. Switching between AFM and optical mode is simply a matter of rotating the objective turret.
A wide selection of measurement modes is available. Whether you work in air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution. For high-performance materials research imaging tasks, the alpha300 A allows local surface properties such as local adhesion or stiffness to be imaged along with topography on the nanometer scale.
The alpha300 A can be optimized for a particular experiment, or it can upgraded as experiments develop and change. It features rock-solid stability, the freedom of modularity, and an optical microscope worthy of the name WITec.
• Materials science
• Life sciences
• Polymer science