AMIGO Crack Microgauge by TSC Inspection Systems
Manufacturer TSC Inspection Systems
The AMIGO instrument is the smallest and lightest ACFM inspection system* available.TSC has taken advantage of its vast wealth of knowledge and experience to make the AMIGO a wieldy, rugged (rated to IP54) instrument that is an ideal tool for site inspections. Specifically designed to function in a wide range of environments the AMIGO has easy-access cabling and large unobstructed buttons which allow the operator to concentrate on the job of inspection without being distracted by the operation o... Read more
AMIGO Crack Microgauge
The AMIGO instrument is the smallest and lightest ACFM inspection system* available.
TSC has taken advantage of its vast wealth of knowledge and experience to make the AMIGO a wieldy, rugged (rated to IP54) instrument that is an ideal tool for site inspections. Specifically designed to function in a wide range of environments the AMIGO has easy-access cabling and large unobstructed buttons which allow the operator to concentrate on the job of inspection without being distracted by the operation of the instrument.
The complete AMIGO system* utilises software that offers crack data collection, defect sizing, offline viewing and data archiving.
System options for the AMIGO include:
Dual-frequency for non-magnetic material inspection
Support for position-feedback probes
Support for multi-channel array probes
TSC has taken advantage of its vast wealth of knowledge and experience to make the AMIGO a wieldy, rugged (rated to IP54) instrument that is an ideal tool for site inspections. Specifically designed to function in a wide range of environments the AMIGO has easy-access cabling and large unobstructed buttons which allow the operator to concentrate on the job of inspection without being distracted by the operation of the instrument.
The complete AMIGO system* utilises software that offers crack data collection, defect sizing, offline viewing and data archiving.
System options for the AMIGO include:
Dual-frequency for non-magnetic material inspection
Support for position-feedback probes
Support for multi-channel array probes
Product Overview
