AFM-Raman System from Renishaw - Extend your understanding of the nanoscale
Renishaw has optimised direct coupling technology, making the inVia Raman microscope the perfect partner for coupling to a wide variety of Scanning Probe Microscopes (SPMs), offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities.
The inVia Raman microscope offers potential for coupling to any SPM or AFM, with fully integrated systems available with scanners from NT-MDT and Nanonics Imaging Ltd.
Key features of the Renishaw AFM-Raman System include:
• Measure physical properties at molecular resolution and chemical analysis at the sub-micrometer scale • Simultaneous Raman and AFM guarantees correlation between images • One platform solution provides confidence, reliability, and ease of use.
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