The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is design...read more
Application Area: 3D Imaging Helios NanoLab™ - DualBeam™
"The automation processes involved with this microscope enable fast acquisition of 3D volumes. The alignment processes are very quick to perform and reliable, although some fine tuning is needed for very accurate imaging. The reliability of the machine allows for the microscope to be left running for days without intervention. Above all, the image quality is amazing allowing near nanometer resolution across a few microns, allowing bulk material to be analysed in detail."
The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and highest quality sample preparation.
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