EXPLORER™

Manufacturer TopoMetrix
3.0
/
5.0
  |  1 reviews


Product Image

TopoMetrix



EXPLORER™'s is a totally new concept in Scanning Probe Microscope (SPM) design. It incorporates TopoMetrix' Scanning Tip Technology™, a unique feature that permits imaging samples of any diameter, thickness or mass. This TopoMetrix-exclusive design also makes it possible to perform contact, non-contact, lateral force, force modulation and other Atomic Force Microscopy (AFM) techniques without any hardware changes.

Product Overview

Product Image

EXPLORER™

Manufacturer TopoMetrix

3.0 / 5.0 | 1 reviews