5420 Atomic Force Microscope (AFM)

Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price. The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners, STM scanner, MACMode & MACMode III and temperature control In addition, the 5420 offers users new electrical single-pass microscopy (ESPM) mode, which enables high-resolution KFM/EFM and PFM, as well as scanning microwave microscopy (SMM) mode, which allows highly sensitive calibrated electrical and spatial characterization Key Features of the Agilent 5400 AFM: Scientific-gr...Read more

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Reviews

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Average Rating: 4.7

Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
4 out of 5
Rating: 4.7
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
4 out of 5
  • Review date: 17 Oct 2014

  • Application Area: Nanotechnology

  • 5420 Atomic Force Microscope (AFM)

"The software, PicoView, is one of the most user-friendly programs I've used with AFM. The technical support staff are extremely helpful. They are always willing to answer questions and troubleshoot. The resolution is excellent and the different modes available are easy to use."

Description

Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.

The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners, STM scanner, MACMode & MACMode III and temperature control

In addition, the 5420 offers users new electrical single-pass microscopy (ESPM) mode, which enables high-resolution KFM/EFM and PFM, as well as scanning microwave microscopy (SMM) mode, which allows highly sensitive calibrated electrical and spatial characterization

Key Features of the Agilent 5400 AFM:

  • Scientific-grade instrument delivers atomic resolution
  • New design provides improved performance
  • New electronics and techniques offer high-resolution KFM/EFM
  • Cost-effective platform offers simple upgrade path

Product Overview

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5420 Atomic Force Microscope (AFM)

by Agilent Technologies

4.7/5.0 (1 reviews)
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
4 out of 5

Agilent Technologies







Receive your quote directly from Agilent Technologies for 5420 Atomic Force Microscope (AFM)

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