5420 Atomic Force Microscope (AFM) by Keysight Technologies
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Status:
Reviewer
Member since: 2010
Organization: Louisiana State University
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- Ease of use
- After sales service
- Value for money
Application Area: Nanotechnology
"The software, PicoView, is one of the most user-friendly programs I've used with AFM. The technical support staff are extremely helpful. They are always willing to answer questions and troubleshoot. The resolution is excellent and the different modes available are easy to use."
Review date: 17 Oct 2014 | 5420 Atomic Force Microscope (AFM)
Based on the popular Keysight 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.
The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners, STM scanner, MACMode & MACMode III and temperature control
In addition, the 5420 offers users new electrical single-pass microscopy (ESPM) mode, which enables high-resolution KFM/EFM and PFM, as well as scanning microwave microscopy (SMM) mode, which allows highly sensitive calibrated electrical and spatial characterization
Key Features of the Keysight 5400 AFM:
- Scientific-grade instrument delivers atomic resolution
- New design provides improved performance
- New electronics and techniques offer high-resolution KFM/EFM
- Cost-effective platform offers simple upgrade path
Product Overview
