The 3View® system provides high resolution imaging of a wide variety of in situ samples in 3D and offers high throughput. The 32k x 24k image support and high performance stages allow fully automated high speed imaging of several types of samples.
Features:
The 3View can use serial block face scanning electron microscopy, or SBFSEM, to obtain serial images. Between each image, a microtome inside the chamber equipped with a diamond knife is used to remove a layer of the sample less than 50 nm thick. This is a fully automated process, meaning that large volumes of data can be acquired rapidly whilst eliminating the risk of human error.