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ZEISS 3DSM by ZEISS Research Microscopy Solutions

Manufacturer ZEISS Research Microscopy Solutions  |  Available Worldwide
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3D surface modelling.


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ZEISS 3DSM
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Your scanning electron microscope measures and analyzes all kinds of samples in 2D: to analyze the surfaces of samples in 3D, use the system extension 3DSM. 3DSM, the computer-based application from ZEISS, provides you with topographical information by reconstructing a complete 3D model of the surface from SEM's AsB-Detector signals.