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Member since: 2004
Organization: Indisa Ghandi Centre For Atomic Research
"A good accessory for TEM Specimen Preparation"
To effectively analyze TEM specimens, it is essential to prepare specimens without significantly altering their microstructure or composition. Current specimen preparation techniques often introduce amorphous damage, specimen contamination, or both. Contamination may also occur in several other ways, including: inadvertent touching of specimens or specimen holders, backstreaming of oil from an oil diffusion pumped ion milling system, EM column contamination and the application of adhesives and/or solvents in the preparation process. Even when great care is taken to clean the specimen, standard cleaning methods are often not 100% successful.
In contrast, the Model 1020 enables specimens to be cleaned immediately before insertion into the electron microscope. It applies a low-energy, high frequency (HF) plasma that effectively cleans a specimen’s surface without changing its elemental composition or structural characteristics. The Model 1020 readily accepts side-entry specimen holders for all commercial TEM’s, and can accept bulk specimens for cleaning before SEM or surface analysis.