- TESCAN ORSAY HOLDING, a.s. and WITec GmbH Launch the RISE Microscope for Correlative Raman-SEM Imaging at analytica 2014
Product News: TESCAN ORSAY HOLDING, a.s. and WITec GmbH Launch the RISE Microscope for Correlative Raman-SEM Imaging at analytica 2014TESCAN ORSAY HOLDING, a.s., a multinational company experienced in charged particle optics, and WITec GmbH, a distinguished German specialist in Raman and scanning probe microscopy, jointly launch RISE Microscopy at Analytica 2014.
RISE Microscopy is a novel correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. This unique combination provides clear advantages for the microscope user with regard to comprehensive sample characterization: electron microscopy is an excellent technique for visualizing the sample surface structures in the nanometer range; confocal Raman imaging is an established spectroscopic method used for the detection of the chemical and molecular components of a sample. It can also generate 2D- and 3D-images and depth profiles to visualize the distribution of the molecular compounds within a sample. The RISE Microscope enables for the first time the acquisition of SEM and Raman images from the same sample area and the correlation of ultra-structural and chemical information with one microscope system.
Both analytical methods are fully integrated into the RISE Microscope. Between the different measurements an extremely precise scan stage automatically transfers the sample inside the microscope’s vacuum chamber and re-positions it. The integrated RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid. “RISE Microscopy enables unprecedented opportunities for the most comprehensive ultra-structural and molecular sample analyses.” explains Dr. Olaf Hollricher, CEO and Director R&D at WITec “The novel RISE Microscope is another striking example of WITec’s enormous innovative strength. It fulfills all requirements of an outstanding, correlative microscopy technique and will convince the Raman as well as the SEM community.”
TESCAN and WITec arranged worldwide sales and after-sales cooperation for the RISE Microscope to take advantage of the synergy effects of both companies. “We are very pleased to cooperate with WITec. Our common purpose is to achieve the utmost customer satisfaction.” says Jaroslav Klíma, Chairman of the Board and CEO at TESCAN ORSAY HOLDING “We consider this an important step in the development of integrated systems for the observation and analysis of samples on the nano-scale. The RISE Microscope enriches the TESCAN portfolio enormously with regard to high-end products and emphasizes our leading position in the electron microscopy market.”
The RISE Microscope provides all functions and features of a stand-alone SEM and a confocal Raman microscope. Both SEM and Raman are high-resolution imaging techniques with sub-nanometer and diffraction limited 200 - 300 nanometer resolution, respectively. In Raman imaging mode the sample can be scanned through a range of 250 µm x 250 µm x 250 µm. RISE Microscopy pairs ease-of-use with exceptional analyzing benefits and is therefore suited to a large variety of applications such as nanotechnology, materials science, and life science.
WITec and TESCAN have jointly developed the RISE Microscope within the framework of the UnivSEM project. UnivSEM receives funding from the European Union Seventh Framework Program (FP7/2007-2013) under grant agreement n° 280566. Companies, universities and research institutes from the Czech Republic, Germany, and Switzerland contribute to the project. The EU-project supports the development of supplementary analysis tools for scanning electron microscopes.
Image caption: The correlative RISE Microscope combines a stand-alone electron microscope and confocal Raman microscope. Through RISE Microscopy, ultra-structural and molecular images of a sample can be for the first time generated and correlated with one instrument.