WITec Introduces True Surface Microscopy
18 Mar 2011

WITec, worldwide leader in nano-analytical microscopy systems, has launched the new True Surface Microscopy option. The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry.

Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows for the first time confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality.

With the new imaging mode, samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterized as they are. Complete system control as well as extensive data evaluation are integrated within the WITec Control and WITec Project software environment, guaranteeing renowned ease-of-use.

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