JEOL Demonstrates New JEM-1400Plus 120kV Transmission Electron Microscope for High Contrast, CryoTEM, and S/TEM Applications

05 Aug 2013
Share
JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8.

Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy Society of America. JEOL and Protochips have combined efforts to showcase the new TEM technology with the Aduro thermal sample holder in the Protochips booth # 504 at M&M 2013, adjacent to the JEOL booth #303.

The new JEM-1400Plus TEM features high resolution/high contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography, and montaging.

This versatile TEM is optimized for biological, polymer, and materials research. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images.

Request Info


Company website

Tags: SEM TEM

JEOL USA