Filtered by: Supplier: Rigaku Corporation (remove this filter)


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TXRF-V310  

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Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300mm wafers
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UltimaIV  

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The Ultima IV multipurpose X-ray diffraction system represents the state of the art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO)...
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Ultimate HomeLab  

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The Ultimate HomeLab™ is the ultimate home x-ray diffraction system, enabling data collection on the widest range of protein crystal samples. The foundation is the FR-E+ SuperBright™...
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UV+ Plate  

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Benchtop imager using visible and UV light
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VariMax™ DW  

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Rigaku VariMax dual-wavelength optic focuses and monochromatizes two different X-ray wavelengths for single-crystal crystallography usage.
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VariMax™ X-ray optics  

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VariMax, the latest generation of Confocal Max-Flux ® (CMF) optics, is a landmark of innovative design and functionality. This is evident by superior performance in delivering a high...
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VSEE300  

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Standalone vapor phase decomposition (VPD) tool
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WaferX 300  

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In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
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WDA-3650  

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Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers
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Xantus  

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Portable RAMAN spectrometer for rapid chemical identification; uniquely available with 532, 785 and 1064 nm laser excitation
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Xantus Mini  

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Remote controlled RAMAN spectrometer for rapid chemical identification; uniquely available with 532, 785 and 1064 nm laser excitation
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Xsight Mneme  

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Suiting a wide range of applications, Rigaku offers the Xsight Mneme system enabling real time visualization for general purpose X-ray imaging applications
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Xsight+  

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The Xsight+ system is a general purpose, large area (15 x 20 mm) X-ray beam imager which provides real time visualization of X-ray beams at synchrotron beamlines or in academic and...
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XtaLAB mini  

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Benchtop small molecule system makes routine self-serve crystallography possible for the synthetic chemist
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ZSX 400: Sequential WDXRF spectrometer  

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The ZSX 400 is a sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples
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ZSX 400: Wavelength dispersive X-ray fluorescence spec...  

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The ZSX 400 is a large sample capability; high power, tube below, sequential WDXRF spectrometer with mapping
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ZSX Primus  

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The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of delivering accurate results in a timely and seamless manner, with unsurpassed reliability,...
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ZSX Primus II  

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The ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above...
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ZSX Primus III  

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Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal...
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