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AccuTOF™ GCv 4G Time-of-Flight Mass Spectrometer  

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The AccuTOF-GCv 4G features the highest sensitivity (S/N >100 at OFN 1 pg/µL) of any time-of-flight Gas Chromatography Mass Spectrometer commercially available. High resolution and mass...
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AccuTOF™-DART™  

4 out of 5

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The JEOL AccuTOF™-DART™ represents a significant breakthrough in mass spectrometry. Now you can analyze solid, liquid and/or gaseous samples at atmospheric pressure and ground potential by...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

6 review(s) of this product / read all

Cross Section Polisher II  

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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ElementEye JSX-1000S EDXRF  

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An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids...
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GCmate™ GC/MS Double-Focusing Mass Spectrometer  

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The world's first benchtop double-focusing mass spectrometer is designed to work together with a gas chromatograph. GCmate™ offers high sensitivity, highly reproducible mass spectra and...
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JEM-1400 Transmission Electron Microscope  

4 out of 5

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The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope  

4 out of 5

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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope  

4 out of 5

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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM  

5 out of 5

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The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JIB-4000 High Throughput FIB  

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The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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JIB-4501 MultiBeam SEM-FIB  

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The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from...
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JIB-4601F Multibeam System  

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All in one tool - Various applications are offered with one instrument: • Optimum-geometry specimen chamber for all functions of FIB milling, SEM imaging, and EDS/EBSD analyses •...
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JMS-S3000 MALDI-TOF MS  

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The JMS-S3000 is a MALDI-TOF MS incorporating JEOL’s unique Spiral TOF ion optic system. Featuring unprecedented levels of mass resolution and sensitivity, the system has been acknowledged...
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JSM-6490LV Scanning Electron Microscope  

4 out of 5

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The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

JSM-6510LV Scanning Electron Microscope  

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JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs!   The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron...
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JSM-6610LV Scanning Electron Microscope  

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JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast...
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JSM-7100F Scanning Electron Microscope  

5 out of 5

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The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large,...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JSM-7500F Scanning Electron Microscope  

4 out of 5

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The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV...
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  • Ease of use 3 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all


 
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