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Pittcon Conference and Expo 2...
05 Mar 2017-09 Mar 2017
AACR Annual Meeting 2017
01 Apr 2017-05 Apr 2017
65th ASMS Conference
04 Jun 2017-08 Jun 2017
MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The Mul... Read more...
We are offering for sale a Veeco Dektak V200SL Profiler. - Setup for 6" and 8" wafers - Stylus-based measurement technology provides step height r... Read more...
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensiti... Read more...
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface chara... Read more...
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity ... Read more...
Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility a... Read more...