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Dektak® 8 Advanced Development Profiler  

3 out of 5

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The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and...
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  • Ease of use 4 out of 5
  • After sales service 2 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Dimension Edge Atomic Force Microscope System  

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The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced...
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Innova Scaning Probe Microscope  

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Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM.
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MSCT Probes  

4 out of 5

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Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 3 out of 5

1 review(s) of this product / read all

MultiMode 8 Scanning Probe Microscope  

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MultiMode 8 Scanning Probe Microscope from Veeco Instruments   The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope...
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Veeco Dektak V200SL Profilometer  

4 out of 5

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We are offering for sale a Veeco Dektak V200SL Profiler. - Setup for 6" and 8" wafers - Stylus-based measurement technology provides step height repeatability for monitoring the...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

1 review(s) of this product / read all


 
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