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Key Features Benefits Multiple LED sources: Blue (465nm), Green (525nm), Yellow (580nm), and Red (635nm) Long lifetimes (>50,0... Read more...
Spectroscopic and Single-Wavelength Ellipsometry. Optically flat surfaces are essential. The sensitivity is usually shot noise limited, and typically is equivalent to an ellipticity of about 10?5, or to a polarisation angle of 10?³ d... Read more...
The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. The new UVISEL... Read more...
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation. Sample analysis takes only a few seconds and provides a complete report that fully describes th... Read more...
FilmTek SE automated benchtop spectroscopic ellipsometer enables highly precise, repeatable film thickness, refractive index, and extinction coefficient measurements on a range of thin and ultra-thin film samples. This budget-friendly ell... Read more...