Secondary Ion (SIMS)



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Select-eV  
Markes International Ltd

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Variable-energy electron ionisation source technology for GC-MS - Select-eV(r). By enabling the energy of ionising electrons to be changed, Select-eV breaks new ground in the field of...
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PHI TRIFT V nanoTOF  
Physical Electronics

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PHI nanoTOF TOF-SIMS The new PHI TRIFT V nanoTOF surface analysis instrument is the next generation of PHI’s highly successful line of TOF-SIMS instruments which utilize the patented...
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