Secondary Ion (SIMS)

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MAX Probe  

The ultimate answer to your analysis needs. Extrel offers a wide range of flange mounted Quadrupole Mass Spectrometers and Residual Gas Analyzers (RGA)that can fit any application or...
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Variable-energy electron ionisation source technology for GC-MS - Select-eV(r). By enabling the energy of ionising electrons to be changed, Select-eV breaks new ground in the field of...
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PHI nanoTOF TOF-SIMS The new PHI TRIFT V nanoTOF surface analysis instrument is the next generation of PHI’s highly successful line of TOF-SIMS instruments which utilize the patented...
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