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JoVE and Luminex Announce a Publication Grant Contest
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16 May 2017-18 May 2017
65th ASMS Conference
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Highest performance AFM-Raman system, now with Bruker's exclusive high-contrast IRIS TERS probes.
Bruker’s Innova-IRIS (Integrated AFM-Raman Ima... Read more...
Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resol... Read more...
QUANTAX WDS with XSense - Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM
QUANTAX WDS features the compact XSense spectrometer. This ... Read more...
QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis
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Superior integration of confocal imaging and photoactivation for biology applications.
The Opterra Multipoint Scanning Confocal Microscope combi... Read more...
World's Ultimate AFM
The new benchmark for speed with highest resolution and performance The Dimension FastScan™ delivers, for the first time, ... Read more...
Uncompromised Imaging and Metrology for Widest Range of Surfaces Combining exceptional profiling performance, operator convenience, and affordabi... Read more...
Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers.
The Dimension Icon® Atomic Force Microscope b... Read more...