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Aspex Explorer  

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The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid...
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Aspex Express  

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The Aspex Express is the fastest integrated bench-top SEM solution on the market today.
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Aspex Extreme  

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The Aspex Extreme is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.
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Certus 3D - Dualbeam  

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The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies. With its TEMLink™ 100 option, the...
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CLM-3D - DualBeam  

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The CLM-3D delivers three-dimensional metrology information to meet the rapid prototyping and process control needs of modern semiconductor manufacturers. Combining an electron...
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CorrSight   

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FEI's CorrSight optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system dedicated to...
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ExSolve Wafer TEM Prep  

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The ExSolve WTP system is an automated, high-throughput sample preparation system that can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300mm in diameter. It is part...
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Helios NanoLab 1200AT - DualBeam  

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The Helios NanoLab 1200AT can create site-specific TEM samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated...
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Helios NanoLab 460F1 - DualBeam  

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The Helios Nanolab 460F1 combines the industry leading, highest resolution Elstar+UC SEM with the most advanced Tomahawk FIB for best-in-class imaging and milling performance. 
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Helios NanoLab 460HP - DualBeam  

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The Helios NanoLab series is the world’s most advanced DualBeam platform for imaging, analysis, and TEM sample preparation in semiconductor failure analysis, process development and process...
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Helios NanoLab™ - DualBeam™   

4 out of 5

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform,...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

4 review(s) of this product / read all

Helios NanoLab™ 660 - DualBeam  

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™...
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Inspect™ - Scanning Electron Microscope   

4 out of 5

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With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Magellan XHR Scanning Electron Microscope  

5 out of 5

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Discover the world of Extreme High Resolution SEM The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Metrios - Transmission Electron Microscope  

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The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. ...
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MLA  

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he MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials,...
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NovaNano - Scanning Electron Microscope  

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The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline...
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Phenom Desktop Scanning Electron Microscope  

4 out of 5

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The world's first personal electron microscope. Why wait? Do it yourself. 20 to 24,000X in 30 seconds. Phenom is a high resolution desktop imaging tool with an optical camera for...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

QEMSCAN - Scanning Electron Microscope  

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QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data,...
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Quanta™ - Scanning Electron Microscope   

5 out of 5

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The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

16 review(s) of this product / read all

Scios - DualBeam™  

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FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With...
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Talos - Transmission Electron Microscope  

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Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences...
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Tecnai - Transmission Electron Microscope   

4 out of 5

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The FEI Tecnai™  transmission electron microscopes are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / read all

Tecnai Arctica - Transmission Electron Microscope  

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The Tecnai Arctica is a powerful, automated high resolution electron microscope for 3D characterization of biological samples. Its revolutionary cryo-based technology easily integrates...
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Tecnai Femto UEM - Transmission Electron Microscope  

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Tecnai™ Femto ultrafast electron microscope (UEM) is a dedicated solution for 4D dynamic electron microscopy at the atomic scale.
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