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Aspex Explorer  
The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid...
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Aspex Express  
The Aspex Express is the fastest integrated bench-top SEM solution on the market today.
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Aspex Extreme  
The Aspex Extreme is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.
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Avizo® Fire  
3D Analysis Software for Materials Science. Avizo Fire offers a broad range of software tools for obtaining and visualizing advanced qualitative and quantitative information on...
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Certus 3D - Dualbeam  
The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies. With its TEMLink™ 100 option, the...
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CLM-3D - DualBeam  
The CLM-3D delivers three-dimensional metrology information to meet the rapid prototyping and process control needs of modern semiconductor manufacturers. Combining an electron...
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CorrSight   
FEI's CorrSight optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system dedicated to...
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ExSolve Wafer TEM Prep  
The ExSolve WTP system is an automated, high-throughput sample preparation system that can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300mm in diameter. It is part...
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Helios NanoLab 1200AT - DualBeam  
The Helios NanoLab 1200AT can create site-specific TEM samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated...
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Helios NanoLab 460F1 - DualBeam  
The Helios Nanolab 460F1 combines the industry leading, highest resolution Elstar+UC SEM with the most advanced Tomahawk FIB for best-in-class imaging and milling performance. 
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Helios NanoLab 460HP - DualBeam  
The Helios NanoLab series is the world’s most advanced DualBeam platform for imaging, analysis, and TEM sample preparation in semiconductor failure analysis, process development and process...
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Helios NanoLab™ - DualBeam™   

4 out of 5


The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform,...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / Read All

Helios NanoLab™ 660 - DualBeam  
The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™...
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Inspect™ - Scanning Electron Microscope   

4 out of 5


With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / Read All

Magellan XHR Scanning Electron Microscope  

5 out of 5


Discover the world of Extreme High Resolution SEM The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

Metrios - Transmission Electron Microscope  

5 out of 5


The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. ...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

MLA  
he MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials,...
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NovaNano - Scanning Electron Microscope  
The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline...
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QEMSCAN - Scanning Electron Microscope  
QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data,...
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Quanta™ - Scanning Electron Microscope   

5 out of 5


The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

16 review(s) of this product / Read All

Scios - DualBeam™  
FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With...
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Talos - Transmission Electron Microscope  
Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences...
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Tecnai - Transmission Electron Microscope   

4 out of 5


The FEI Tecnai™  transmission electron microscopes are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / Read All

Tecnai Arctica - Transmission Electron Microscope  
The Tecnai Arctica is a powerful, automated high resolution electron microscope for 3D characterization of biological samples. Its revolutionary cryo-based technology easily integrates...
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Tecnai Femto UEM - Transmission Electron Microsc...  
Tecnai™ Femto ultrafast electron microscope (UEM) is a dedicated solution for 4D dynamic electron microscopy at the atomic scale.
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