Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (90)

Electron Microscopy Accessories (39)



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SU8000 Series UHR Cold-Emission FE-SEM  
Hitachi High Technologies America, Inc.

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The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
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SU8200 Series CFE SEM  
Hitachi High Technologies America, Inc.

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Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi...
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SU9000 UHR FE-SEM  
Hitachi High Technologies America, Inc.

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The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM  
Hitachi High Technologies America, Inc.

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Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Ultra-high Resolution Scanning Electron Microscope S-5...  

5 out of 5


Hitachi High-Technologies Corp (Microscopy)

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Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Cross Section Polisher II  
JEOL USA

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JEM-1400 Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope  

4 out of 5


JEOL USA

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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM  

5 out of 5


JEOL USA

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The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JIB-4000 High Throughput FIB  
JEOL USA

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The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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JIB-4501 MultiBeam SEM-FIB  
JEOL USA

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The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from...
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JIB-4601F Multibeam System  
JEOL USA

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All in one tool - Various applications are offered with one instrument: • Optimum-geometry specimen chamber for all functions of FIB milling, SEM imaging, and EDS/EBSD analyses •...
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JSM-6490LV Scanning Electron Microscope  

4 out of 5


JEOL USA

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The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

JSM-6510LV Scanning Electron Microscope  
JEOL USA

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JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs!   The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron...
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JSM-6610LV Scanning Electron Microscope  
JEOL USA

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JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast...
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JSM-7100F Scanning Electron Microscope  

5 out of 5


JEOL USA

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The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large,...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JSM-7500F Scanning Electron Microscope  

4 out of 5


JEOL USA

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The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV...
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  • Ease of use 3 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

NeoScope Benchtop SEM  
Nikon Instruments Europe

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The NeoScope benchtop SEM economically complements both optical microscopes and traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution...
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3D EDS Analysis  
Oxford Instruments Inc.

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Overview • Automated, FIB milling is followed by EDS X-ray map acquisition for each slice • Fast, data collection uses unique large area X-MaxN SDD • Complete, collection of the...
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AZtecEnergy - EDS Software  
Oxford Instruments Inc.

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AZtecEnergy will change the way you collect, process and view EDS data. Whether novice or expect, you’ll gather more accurate results, see everything in stunning high resolution, and finish...
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X-act - 10mm2 SDD Detector  
Oxford Instruments Inc.

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x-act incorporates 40 years of Oxford Instruments’ expertise,and is backed up by worldwide sales, service and customer support specialists. Overview • Detects elements from Be to Pu ...
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X-Max SDD Detector  

4 out of 5


Oxford Instruments Inc.

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X-MaxN comes in a range of detector sizes, from 20 mm2 for microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

108 Auto Sputter Coater  
Ted Pella Inc.

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108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality...
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PELCO easiGlow™ Glow Discharge Cleaning System  

5 out of 5


Ted Pella Inc.

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For one of the most common glow discharge applications, making TEM support films or grids hydrophilic using air, the PELCO easiGlow™ uses an automated and quick cycle with fully selectable...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

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