Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (91)

Electron Microscopy Accessories (38)



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PP3010T Cryo-SEM Preparation System  
Electron Microscopy Sciences

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The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM. The PP3010T has all the...
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QUANTIFOIL® – Holey Carbon Films  

4 out of 5


Electron Microscopy Sciences

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QUANTIFOIL® is a perforated support foil with pre-defined hole size, shape and arrangement. It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS)...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

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It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

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The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

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The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

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Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

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Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM  
Hitachi High Technologies America, Inc.

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The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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SU6600 Analytical VP FE-SEM  

4 out of 5


Hitachi High Technologies America, Inc.

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The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

SU-70 UHR Schottky (Analytical) FE-SEM  
Hitachi High Technologies America, Inc.

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SU8000 Series UHR Cold-Emission FE-SEM  
Hitachi High Technologies America, Inc.

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The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
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SU8200 Series CFE SEM  
Hitachi High Technologies America, Inc.

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Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi...
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SU9000 UHR FE-SEM  
Hitachi High Technologies America, Inc.

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The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM  
Hitachi High Technologies America, Inc.

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Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Ultra-high Resolution Scanning Electron Microscope S-5...  

5 out of 5


Hitachi High-Technologies Corp (Microscopy)

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Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Cross Section Polisher II  
JEOL USA

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JEM-1400 Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope  

4 out of 5


JEOL USA

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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM  

5 out of 5


JEOL USA

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The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

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