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66th ASMS Conference
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The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been optimized for low-voltage imaging, extremely high surf... Read more...
Field Emission-SEM for advanced analytical microscopy The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with ... Read more...
EVO 18 provides excellent quality imaging results from an analytical microscope with the capability to handle all material types EVO 18 offers Energy and Wavelength Dispersive Spectroscopy (EDS & WDS) ports as standard. A fully int... Read more...
Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber si... Read more...
Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. With Crossbeam you combine the imaging and analytical performance of the GEMINI column with t... Read more...
Your Automated Quantitative Petrological Analyzer. Read more...
From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World. Read more...
Three Ion Beams for Total Flexibility in Sub-10 nm Fabrication. Read more...
Bridge the Micro and Nano World in Materials Inspection and Analysis. Read more...
Your Interactive SEM for Multi-User Environments Read more...
High performance, total flexibility EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning electron microscopy The unmatched low-kV resolution mak... Read more...
Your Field Emission SEMs for High Quality Imaging and Advanced Analytical Microscopy. Read more...
ParticleSCAN VP: A New Dimension in Process Control ParticleSCAN VP is an exciting addition to the Carl Zeiss portfolio of scanning electron microscopes (SEM). ParticleSCAN has been developed for a range of industrial environments ei... Read more...
JetSCAN: The Portable SEM for Dedicated Aircraft Engine Health Monitoring Combining powerful data interpretation and risk assessment tools within a single turnkey unit JetSCAN represents the pre-eminent diagnostic and prediction tool f... Read more...
Your Field Emission SEMs for Sub-nanometer, Low Voltage Images From Any Sample. Read more...
The Core of Your Mine-Site Mineralogy Laboratory. Read more...
Your Dedicated Solution for Digital Petrophysical Analysis. Read more...
The World's Fastest Scanning Electron Microscopes. Read more...
Speed Up Your Correlative Workflow. Read more...
Handling, processability and performance of a material are dictated by its bulk physical properties. At LGC, we believe that characterisation and accurate measurement of crucial material attributes are an essential part of product developm... Read more...
RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. RISE Microscopy combines an SEM and a confocal R... Read more...
Correlating Cryofixed Biological Samples in the Light- and Electron Microscope. Read more...
The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The New Analytical Chamber Provides • Segment, Ultra... Read more...