Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (90)

Electron Microscopy Accessories (39)



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8500 Field Emission Scanning Electron Microscope (FE-S...  
Agilent Technologies

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The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been...
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ATLAS  
ZEISS Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for...
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ATLAS 3D  
ZEISS Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS 3D is a package of hard- and software specifically designed for FIB nanotomography. You automatically create a 3D data stack at a...
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AURIGA  
ZEISS Microscopy

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AURIGA, the CrossBeam System combines the 3D imaging and analysis performance of the GEMINI e-Beam column with the ability of a FIB for material processing and sample preparation on a...
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AURIGA Compact  
ZEISS Microscopy

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Enter the 3D Nano-World with CrossBeam Technology AURIGA Compact is your FIB-SEM to enter the world of 3D nanotomography. Profit from the proven Carl Zeiss CrossBeam technology. Combine...
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AURIGA Laser  
ZEISS Microscopy

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Large-scale material removal and far-reaching analysis: fast, flexible, and integrated. AURIGA Laser combines an electron microscope with extremely fast material removal and precise...
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Crossbeam FIB-SEM  
ZEISS Microscopy

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Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. With Crossbeam you combine the imaging and...
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EVO 18 SEM  

4 out of 5


ZEISS Microscopy

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EVO 18 provides excellent quality imaging results from an analytical microscope with the capability to handle all material types EVO 18 offers Energy and Wavelength Dispersive...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

EVO HD  
ZEISS Microscopy

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High performance, total flexibility EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning...
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EVO LS  
ZEISS Microscopy

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High performance, total flexibility EVO LS is the ideal SEM for the Life Science community, an arena that throws up difficult imaging challenges on a regular basis. EVO LS is a true...
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EVO MA  
ZEISS Microscopy

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High performance, total flexibility The EVO MA (Materials Analysis) series of scanning electron microscopes are an indispensable tool for every application area in materials analysis.
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JetSCAN  
ZEISS Microscopy

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JetSCAN: The Portable SEM for Dedicated Aircraft Engine Health Monitoring Combining powerful data interpretation and risk assessment tools within a single turnkey unit JetSCAN...
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MERLIN Compact  
ZEISS Microscopy

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From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in...
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MERLIN for Life Sciences  
ZEISS Microscopy

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Highest Beam Current in a Nanometer Size Spot Based on the new GEMINI II column and the ZEISS Complete Detection System, MERLIN is the ideal solution for complete image analysis and...
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MERLIN for Materials  
ZEISS Microscopy

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From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in...
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Mineralogic Mining Systems  
ZEISS Microscopy

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Your Automated Quantitative Petrological Analyzer. Characterize minerals and achieve maximum recovery of resources. With Mineralogic Mining you use automated mineral analysis to...
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ORION NanoFab  
ZEISS Microscopy

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Your 3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring With ORION NanoFab you profit from the only system in the world that covers the complete range of micromachining to...
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ParticleSCAN VP  
ZEISS Microscopy

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ParticleSCAN VP: A New Dimension in Process Control ParticleSCAN VP is an exciting addition to the Carl Zeiss portfolio of scanning electron microscopes (SEM). ParticleSCAN has been...
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Shuttle & Find for Life Sciences  
ZEISS Microscopy

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Shuttle & Find for Life Sciences - Bridging the Micro and Nano Worlds Carl Zeiss presents the first easy-to-use, highly productive workflow from a light to an electron microscope and...
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Shuttle & Find for Material Analysis  
ZEISS Microscopy

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Bridge the Gap between Light and Electron Microscopy Precisely Locate Regions of Interest – in Minutes Electron beam lithography (EBL) is the key method used to fabricate functional...
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SIGMA  
ZEISS Microscopy

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Your FE-SEM for Nanoscale Analytics The SIGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column...
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SIGMA VP  

5 out of 5


ZEISS Microscopy

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Field Emission-SEM for advanced analytical microscopy The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

SmartSEM  
ZEISS Microscopy

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Use SmartSEM to fully control all operational parameters SmartSEM is your software solution for SEM, FE-SEM and FIB-SEM. Choose between different operating modes for the GUI depending...
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ZEISS Crossbeam 340 and Crossbeam 540  
ZEISS Microscopy

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Your FIB-SEMs for Nanotomography and Nanofabrication Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and...
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ZEMAS  
ZEISS Microscopy

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ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from...
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EM CPD300  

5 out of 5


Leica Microsystems

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The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Ion Beam Slope Cutter Leica EM TIC 3X  
Leica Microsystems

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chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than...
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Leica EM AMW - Tissue Processor for Electron Microscopy  
Leica Microsystems

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With minimal user interface, rapidly process, embed, and polymerize specimens into resin with the Leica EM AMW’s unique, highly automated system. The patented combination of microwave...
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Leica EM FC7 - Cryochamber  
Leica Microsystems

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Change your Ultramicrotome Leica EM UC6 or Leica EM UC7 to a Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for...
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Leica EM GP  

5 out of 5


Leica Microsystems

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For the preparation of vitrified fluid samples or extremely thin samples for cryo-TEM, including biological suspensions and industrial emulsions in both, aqueous and inorganic solvents. ...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Leica EM KMR3 - Glass Knifemaker  
Leica Microsystems

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Perfect Glass Knives for perfect ultrathin sections for EM and LM applications The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6,4 mm, 8...
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Leica EM MED020 - Modular High Vacuum Coating System  
Leica Microsystems

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The Leica EM MED020 is a precision high vacuum coating system for sputtering, carbon thread, carbon rod, top down and bottom up thermal resistance and dual electron beam evaporation. ...
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Leica EM SPF - Self Pressurised Freezer  
Leica Microsystems

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Are you looking for an alternative cryo-fixation method to freeze your biological specimens such as cells, free-living bacteria, yeast cells, unicellular organisms etc. in their native...
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Leica EM TP - Automated Routine Tissue Processor  
Leica Microsystems

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The innovative Leica EM TP is the first tissue processor designed for EM and LM resin processing, that features a heating/cooling system with pre-heat and pre-cool capabilities to maintain...
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Leica EM UC7 - Ultramicrotome  

4 out of 5


Leica Microsystems

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The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

Imaris Measurement Pro  
Bitplane AG (Part of the Andor Group)

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Because Your Image Is More Than A Pretty Picture Imaris MeasurementPro enables researchers to extract critical statistical parameters from their microscopy images thus allowing for the...
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ImarisTrack  
Bitplane AG (Part of the Andor Group)

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Discover the Meaning of Motion ImarisTrack is the most powerful commercially available tracking program that rises to the challenge of monitoring temporal changes in biological systems...
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Aspex Explorer  
FEI Company

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The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid...
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Aspex Express  
FEI Company

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The Aspex Express is the fastest integrated bench-top SEM solution on the market today.
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Aspex Extreme  
FEI Company

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The Aspex Extreme is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.
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Avizo® Fire  
FEI Company

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3D Analysis Software for Materials Science. Avizo Fire offers a broad range of software tools for obtaining and visualizing advanced qualitative and quantitative information on...
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Certus 3D - Dualbeam  
FEI Company

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The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies. With its TEMLink™ 100 option, the...
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CLM-3D - DualBeam  
FEI Company

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The CLM-3D delivers three-dimensional metrology information to meet the rapid prototyping and process control needs of modern semiconductor manufacturers. Combining an electron...
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CorrSight   
FEI Company

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FEI's CorrSight optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system dedicated to...
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ExSolve Wafer TEM Prep  
FEI Company

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The ExSolve WTP system is an automated, high-throughput sample preparation system that can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300mm in diameter. It is part...
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Helios NanoLab 1200AT - DualBeam  
FEI Company

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The Helios NanoLab 1200AT can create site-specific TEM samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated...
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Helios NanoLab 460F1 - DualBeam  
FEI Company

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The Helios Nanolab 460F1 combines the industry leading, highest resolution Elstar+UC SEM with the most advanced Tomahawk FIB for best-in-class imaging and milling performance. 
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Helios NanoLab 460HP - DualBeam  
FEI Company

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The Helios NanoLab series is the world’s most advanced DualBeam platform for imaging, analysis, and TEM sample preparation in semiconductor failure analysis, process development and process...
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Helios NanoLab™ - DualBeam™   

4 out of 5


FEI Company

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform,...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

4 review(s) of this product / read all

Helios NanoLab™ 660 - DualBeam  
FEI Company

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™...
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Inspect™ - Scanning Electron Microscope   

4 out of 5


FEI Company

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With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Magellan XHR Scanning Electron Microscope  

5 out of 5


FEI Company

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Discover the world of Extreme High Resolution SEM The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Metrios - Transmission Electron Microscope  
FEI Company

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The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. ...
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MLA  
FEI Company

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he MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials,...
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NovaNano - Scanning Electron Microscope  
FEI Company

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The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline...
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QEMSCAN - Scanning Electron Microscope  
FEI Company

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QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data,...
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Quanta™ - Scanning Electron Microscope   

5 out of 5


FEI Company

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The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

16 review(s) of this product / read all

Scios - DualBeam™  
FEI Company

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FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With...
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Talos - Transmission Electron Microscope  
FEI Company

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Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences...
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Tecnai - Transmission Electron Microscope   

4 out of 5


FEI Company

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The FEI Tecnai™  transmission electron microscopes are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / read all

Tecnai Arctica - Transmission Electron Microscope  
FEI Company

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The Tecnai Arctica is a powerful, automated high resolution electron microscope for 3D characterization of biological samples. Its revolutionary cryo-based technology easily integrates...
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Tecnai Femto UEM - Transmission Electron Microscope  
FEI Company

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Tecnai™ Femto ultrafast electron microscope (UEM) is a dedicated solution for 4D dynamic electron microscopy at the atomic scale.
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Tecnai G2 - Transmission Electron Microscope  
FEI Company

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The Tecnai G2 transmission electron microscope unifies fast, efficient and easy operation with proven reliability to serve many applications needs – from basic, rapid sample screening to...
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Tecnai iCorr - Transmission Electron Microscope  
FEI Company

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Tecnai with iCorr is unique in the way it solves the challenges related to CLEM. It's an integrated instrument in terms of hardware and software that seamlessly merges EM imaging with...
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Tecnai Osiris - Transmission Electron Microscope  
FEI Company

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he Tecnai Osiris™ is a fully digital 200 kV S/TEM system, designed to deliver revolutionary analytical performance in all imaging and analytical modes. Tecnai Osiris features the unique...
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Tecnai with iCorr - A Fully Integrated Correlative Sol...  
FEI Company

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FEI’s fast, accurate and automated solution for correlative light and electron microscopy, Tecnai with iCorr is the first integrated light and electron microscope. Combining a fluorescence...
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Titan ETEM G2 - Transmission Electron Microscope  
FEI Company

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Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.
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Titan Halo  
FEI Company

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Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. The Titan Halo™...
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Titan Krios™ - Transmission Electron Microscope  
FEI Company

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The Titan Krios™ transmission electron microscope is tailored for use in protein and cellular imaging. Its revolutionary cryo-based technology and stability permits a full range of...
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Titan Themis - Transmission Electron Microscope  
FEI Company

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 Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale...
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Titan™ - Transmission Electron Microscope  

4 out of 5


FEI Company

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Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

7 review(s) of this product / read all

V400 ACE - Focused Ion Beam  
FEI Company

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The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic materials and complex interconnect...
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Verios (XHR) - Scanning Electron Microscope  
FEI Company

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The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for...
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Versa 3D - DualBeam™  
FEI Company

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Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers...
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Vion Plasmsa - Focused Ion Beam  
FEI Company

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The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. ...
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ASPEX EXplorer™  

4 out of 5


ASPEX, LLC

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The Only Integrated SEM/EDX System Now in its third generation, the ASPEX EXplorer is a scanning electron microscope that is designed for the automated imaging and elemental analysis of...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

QUANTAX Micro-XRF  
Bruker-Nano

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QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF...
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QUANTAX WDS  
Bruker-Nano

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QUANTAX WDS with XSense - Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM QUANTAX WDS features the compact XSense spectrometer. This high precision instrument incorporates...
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1020 Plasma Cleaner  

4 out of 5


E.A. Fischione Instrumental Inc.

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For optimal imaging and microanalysis in electron microscopy, it is imperative to have a clean, well-prepared specimen. This is especially true for many modern electron microscopes, which...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Automatic Twin-Jet Electropolisher  
E.A. Fischione Instrumental Inc.

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High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any...
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Model 1040 NanoMill® TEM specimen preparation system  
E.A. Fischione Instrumental Inc.

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Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens...
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Model 190 Cryo-Can for SEM  
E.A. Fischione Instrumental Inc.

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Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample...
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Model 2020 Advanced Tomography Holder  

4 out of 5


E.A. Fischione Instrumental Inc.

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Ideal for room temperature electron tomography High tilt in narrow gap pole pieces Optimized specimen retention Extended field of view Easy, accurate specimen...
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  • Ease of use 3 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Model 3000 Annular Dark Field Detector  
E.A. Fischione Instrumental Inc.

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High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows...
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PP3010T Cryo-SEM Preparation System  
Electron Microscopy Sciences

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The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM. The PP3010T has all the...
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QUANTIFOIL® – Holey Carbon Films  

4 out of 5


Electron Microscopy Sciences

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QUANTIFOIL® is a perforated support foil with pre-defined hole size, shape and arrangement. It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS)...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5


Gatan Inc.

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The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

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It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

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The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

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The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

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Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

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Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM  
Hitachi High Technologies America, Inc.

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The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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SU6600 Analytical VP FE-SEM  

4 out of 5


Hitachi High Technologies America, Inc.

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The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

SU-70 UHR Schottky (Analytical) FE-SEM  
Hitachi High Technologies America, Inc.

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